Title :
The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS Devices
Author :
Kolasinski, W.A. ; Koga, R. ; Schnauss, E. ; Duffey, J.
Author_Institution :
Space Sciences Laboratory the Aerospace Corporation P. O. Box 92957, Los Angeles, CA 90009
Abstract :
Equipment for testing microcircuits at elevated temperatures for Single Event Phenomena (SEP) such as upset (SEU) and latchup (SEL) has been developed and measurements on several device types have been performed. Very large changes in cross-section and threshold LET have been observed over the temperature range of 25°C to 120°C for SEU and SEL.
Keywords :
Argon; Cyclotrons; Hardware; Instruments; Laboratories; Land surface temperature; Performance evaluation; Single event upset; System testing; Temperature distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334649
