Title :
The SEU Risk Assessment of Z80A, 8086 and 80C86 Microprocessors Intended for Use in a Low Altitude Polar Orbit
Author :
Harboe-Sorensen, R. ; Adams, L. ; Daly, E.J. ; Sansoe, C. ; Mapper, D. ; Sanderson, T.K.
Author_Institution :
European Space Agency/ESTEC, Noordwijk, The Netherlands
Abstract :
This paper presents the results of a test and analysis program carried out in support of an Earth Resources Satellite project in order to provide a quantitative SEU risk assessment for certain microprocessor based subsystems. The key features of the program were the low cost and comparative simplicity of the test techniques which, nevertheless, provided sufficient data for a quantitative risk assessment using the CREME suite of programs.
Keywords :
Automatic testing; Computational modeling; Costs; Earth; Electrostatics; Microprocessors; Particle scattering; Risk management; Satellites; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334653
