An Approach to Measure Ultrafast-Funneling-Current Transients

Funneling-current transients are predicted to occur on a picosecond time scale. We have developed an advanced approach to measure picosecond single-event-upset currents in semiconductor devices with <40 ps time resolution. Our approach utilizes high-bandwidth sampling of repetitively-produced events. In this paper we describe the experimental approach and report characterization studies of the time resolution of the measurement components. We also report first measurements of picosecond single-event-current transients.