Mechanical behavior of ceramic capacitors

Author

Koripella, Chowdary Ramesh

Author_Institution

KEMET Electron. Corp., Greenville, SC, USA

Volume

14

Issue

4

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

718

Lastpage

724

Abstract

Fracture toughness, modulus of rupture (MOR), and thermal shock resistance were evaluated on COG, X7R, and Z5U type commercial ceramic capacitors with and without internal electrodes. Fracture toughness measurements show similar values for X7R and Z5U dielectrics and a slightly higher value for COG dielectrics. The presence of electrodes slightly increases the strength of all the dielectrics. MOR measurements indicate that the COG samples are relatively stronger, followed by X7R and Z5U dielectrics. Weibull modulus values are higher for X7R dielectrics followed by COG and Z5U dielectrics. These results show that the critical temperature difference for fracture initiation is close to 75°C for 5819 size samples and close to 125°C for 1206 size Z5U and 150°C for X7R and COG dielectrics

Keywords

capacitors; electron device testing; fracture toughness testing; thermal stress cracking; COG dielectrics; Weibull modulus; X7R dielectrics; Z5U dielectrics; ceramic capacitors; critical temperature difference; fracture initiation; fracture toughness; internal electrodes; mechanical behaviour; modulus of rupture; thermal shock resistance; Capacitors; Ceramics; Dielectric materials; Dielectric measurements; Electric shock; Electrical resistance measurement; Electrodes; Mechanical factors; Thermal resistance; Thermal stresses;

fLanguage

English

Journal_Title

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

0148-6411

Type

jour

DOI

10.1109/33.105123

Filename

105123