Title :
Noise Properties of Fe-ZnO Nanorod Ultraviolet Photodetectors
Author :
Shoou-Jinn Chang ; Chung-Wei Liu ; Chih-Hung Hsiao ; Kuang-Yao Lo ; Sheng-Joue Young ; Tsung-Hsien Kao ; Kai-Shiang Tsai ; San-Lein Wu
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
This letter reports the development of Fe-doped ZnO (FZO) nanorods via a low-temperature hydrothermal method and the fabrication of FZO nanorod metal-semiconductor-metal (MSM) photodetector (PD). The average length and diameter of the FZO nanorods were 4.5 μm and ~ 100 nm, respectively. The ultraviolet-to-visible rejection ratio of the sample was ~ 23 when biased at 1 V, and the fabricated PD was visible-blind with a sharp cut-off at 375 nm. Furthermore, the noise equivalent power and detectivity of the fabricated FZO nanorod MSM PD were 6.27×10-10 W and 2.12×1010 cm·Hz0.5·W-1, respectively.
Keywords :
II-VI semiconductors; iron; metal-semiconductor-metal structures; nanophotonics; nanorods; optical fabrication; optical noise; photodetectors; ultraviolet detectors; wide band gap semiconductors; zinc compounds; MSM PD; ZnO:Fe; low-temperature hydrothermal method; metal-semiconductor-metal photodetector; nanorod diameter; nanorod length; nanorod ultraviolet photodetectors; noise equivalent power; noise properties; size 100 nm; size 4.5 mum; ultraviolet-to-visible rejection ratio; visible-blind PD; voltage 1 V; wavelength 375 nm; Current measurement; Noise; Photodetectors; Semiconductor device measurement; Temperature; Temperature measurement; Zinc oxide; FZO nanorod; hydrothermal; noise; photodetector;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2013.2281467
