DocumentCode
887403
Title
On the logic delay in MOS LSI static NOR designs
Author
Puri, Yogishwar
Volume
14
Issue
4
fYear
1979
fDate
8/1/1979 12:00:00 AM
Firstpage
716
Lastpage
723
Abstract
Conventional definitions of logic block delay are reviewed and a preferred one is proposed, on a statistical basis, for the static NOR circuits in an LSI MOSFET technology. According to this definition, the delay is based on the actual circuit thresholds depends minimally on the input transition rate and is always positive. Moreover critical pulsewidths are given directly in terms of block delays. Using this definition, the block and path delay statistics are derived for use in CAD simulation of chip logic and performance in some limited sense. Finally, examples are given illustrating the use of delay definition in chip delay and pulsewidth.
Keywords
Field effect integrated circuits; Integrated logic circuits; Large scale integration; NOR circuits; field effect integrated circuits; integrated logic circuits; large scale integration; Circuit simulation; Circuit testing; Computational modeling; Delay; FETs; Large scale integration; Logic circuits; Logic design; Logic testing; Production;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1979.1051249
Filename
1051249
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