• DocumentCode
    887403
  • Title

    On the logic delay in MOS LSI static NOR designs

  • Author

    Puri, Yogishwar

  • Volume
    14
  • Issue
    4
  • fYear
    1979
  • fDate
    8/1/1979 12:00:00 AM
  • Firstpage
    716
  • Lastpage
    723
  • Abstract
    Conventional definitions of logic block delay are reviewed and a preferred one is proposed, on a statistical basis, for the static NOR circuits in an LSI MOSFET technology. According to this definition, the delay is based on the actual circuit thresholds depends minimally on the input transition rate and is always positive. Moreover critical pulsewidths are given directly in terms of block delays. Using this definition, the block and path delay statistics are derived for use in CAD simulation of chip logic and performance in some limited sense. Finally, examples are given illustrating the use of delay definition in chip delay and pulsewidth.
  • Keywords
    Field effect integrated circuits; Integrated logic circuits; Large scale integration; NOR circuits; field effect integrated circuits; integrated logic circuits; large scale integration; Circuit simulation; Circuit testing; Computational modeling; Delay; FETs; Large scale integration; Logic circuits; Logic design; Logic testing; Production;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1979.1051249
  • Filename
    1051249