DocumentCode :
887403
Title :
On the logic delay in MOS LSI static NOR designs
Author :
Puri, Yogishwar
Volume :
14
Issue :
4
fYear :
1979
fDate :
8/1/1979 12:00:00 AM
Firstpage :
716
Lastpage :
723
Abstract :
Conventional definitions of logic block delay are reviewed and a preferred one is proposed, on a statistical basis, for the static NOR circuits in an LSI MOSFET technology. According to this definition, the delay is based on the actual circuit thresholds depends minimally on the input transition rate and is always positive. Moreover critical pulsewidths are given directly in terms of block delays. Using this definition, the block and path delay statistics are derived for use in CAD simulation of chip logic and performance in some limited sense. Finally, examples are given illustrating the use of delay definition in chip delay and pulsewidth.
Keywords :
Field effect integrated circuits; Integrated logic circuits; Large scale integration; NOR circuits; field effect integrated circuits; integrated logic circuits; large scale integration; Circuit simulation; Circuit testing; Computational modeling; Delay; FETs; Large scale integration; Logic circuits; Logic design; Logic testing; Production;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1979.1051249
Filename :
1051249
Link To Document :
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