Title :
Microwave dielectric constant of a low temperature cofired ceramic
Author :
Gipprich, John W. ; Leahy, Kevin A. ; Martin, Angela J. ; Rich, Edward L., III ; Sparks, Keith W.
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
fDate :
12/1/1991 12:00:00 AM
Abstract :
Evaluation of low-temperature, cofired ceramic multilayer packaging material at microwave frequencies has revealed a lower dielectric constant than the standard measurement at 1 MHz. Examination of resonance comparisons in both the authors´ and in previously published work suggests similar conclusions. Measurements using various resonators produced results in agreement with the derivations from other indirect methods. Time-domain network measurements on microstrip structures designed with the 1-MHz dielectric constant and on revised structures using the dielectric constant are in agreement with the measured values. A functional three-dimensional test structure is described
Keywords :
ceramics; dielectric loss measurement; microwave measurement; packaging; permittivity measurement; strip lines; 45 MHz to 18 GHz; ceramic multilayer packaging material; dielectric constant; loss tangent; low temperature cofired ceramic; microstrip structures; microwave frequencies; relative permittivity; resonators; three-dimensional test structure; time domain network measurements; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Measurement standards; Microwave frequencies; Microwave measurements; Nonhomogeneous media; Packaging; Temperature;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
