• DocumentCode
    887714
  • Title

    Dealing with early life failures

  • Author

    Kwang-Ting Tim Cheng

  • Author_Institution
    University of California, Santa Barbara
  • Volume
    23
  • Issue
    2
  • fYear
    2006
  • Firstpage
    85
  • Lastpage
    85
  • Abstract
    D&T editor in chief Tim Cheng discusses the industry´s struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.
  • Keywords
    IDDQ; burn-in; embedded systems; latent defects; technology scaling; IDDQ; burn-in; embedded systems; latent defects; technology scaling;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.39
  • Filename
    1613785
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=887714