Title :
Dealing with early life failures
Author :
Kwang-Ting Tim Cheng
Author_Institution :
University of California, Santa Barbara
Abstract :
D&T editor in chief Tim Cheng discusses the industry´s struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.
Keywords :
IDDQ; burn-in; embedded systems; latent defects; technology scaling; IDDQ; burn-in; embedded systems; latent defects; technology scaling;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.39
