DocumentCode :
887842
Title :
Influence of polysilicon deposition on fabrication of power polysilicon emitter bipolar transistors
Author :
Austin, Patrick ; Caminade, J. ; Sanchez, Jose L.
Author_Institution :
CNRS, Toulouse, France
Volume :
29
Issue :
9
fYear :
1993
fDate :
4/29/1993 12:00:00 AM
Firstpage :
741
Lastpage :
743
Abstract :
The aim was to fabricate a polysilicon emitter bipolar transistor for power applications. To this end, different polysilicon deposition steps compatible with the power bipolar technology and their influence on electrical characteristics were studied.
Keywords :
bipolar transistors; chemical vapour deposition; elemental semiconductors; oxidation; power transistors; silicon; I-V characteristics; LPCVD; SIMS depth profiles; Si; Si-SiO 2; electrical characteristics; polysilicon deposition; power bipolar technology; power polysilicon emitter bipolar transistors; thin interfacial oxide; wafer loading;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19930497
Filename :
211240
Link To Document :
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