• DocumentCode
    887885
  • Title

    Boolean method for selection of minimal set of test nodes for analogue fault dictionary

  • Author

    Prasad, V.C. ; Pinjala, S.N.R.

  • Author_Institution
    India Inst. of Technol., New Delhi, India
  • Volume
    29
  • Issue
    9
  • fYear
    1993
  • fDate
    4/29/1993 12:00:00 AM
  • Firstpage
    747
  • Lastpage
    749
  • Abstract
    A novel method using Boolean algebra is presented to obtain a minimal as well as the smallest set of test nodes in the dictionary approach to analogue fault diagnosis. This reduces the number of accessible terminals and hence the number of measurements.
  • Keywords
    Boolean algebra; analogue circuits; fault location; Boolean algebra; accessible terminals; analogue fault diagnosis; analogue fault dictionary; minimal set of test nodes;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19930501
  • Filename
    211244
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=887885