Title :
Boolean method for selection of minimal set of test nodes for analogue fault dictionary
Author :
Prasad, V.C. ; Pinjala, S.N.R.
Author_Institution :
India Inst. of Technol., New Delhi, India
fDate :
4/29/1993 12:00:00 AM
Abstract :
A novel method using Boolean algebra is presented to obtain a minimal as well as the smallest set of test nodes in the dictionary approach to analogue fault diagnosis. This reduces the number of accessible terminals and hence the number of measurements.
Keywords :
Boolean algebra; analogue circuits; fault location; Boolean algebra; accessible terminals; analogue fault diagnosis; analogue fault dictionary; minimal set of test nodes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19930501
