High-resolution A/D conversion in MOS/LSI

Author

Fotouhi, Bahram ; Hodges, David A.

Volume

14

Issue

6

fYear

1979

fDate

12/1/1979 12:00:00 AM

Firstpage

920

Lastpage

926

Abstract

A new successive approximation analog-to-digital conversion technique compatible with most MOS process technologies is described. This technique combines a string of equal value diffused resistors and a binary ratioed capacitor array in a unique circuit configuration so that 12-bit monotonicity is achieved with only 8-bit ratio-accurate circuit elements. The comparator is realized by a chopper-stabilized amplifier to reduce the inherently high input offset voltages of MOS amplifiers. Typical performance characteristics taken from a sample of ICs are presented; 12-bit monotonic conversion with differential nonlinearity less than 1/2 LSB is completed in 50 μs. The die area, less logic, is 12000 mil/SUP 2/. Because of assured 12-bit monotonicity, this converter should find applications of closed-loop control systems. It seems feasible to extend this technique to 14-bit resolution for use in applications such as digital audio systems.

Keywords

Analogue-digital conversion; Field effect integrated circuits; Large scale integration; analogue-digital conversion; field effect integrated circuits; large scale integration; Analog-digital conversion; Audio systems; Control systems; Integrated circuit yield; Large scale integration; MOS capacitors; Monolithic integrated circuits; Resistors; Transfer functions; Voltage;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.1979.1051298

Filename

1051298