Title :
Compact BIC sensor for Iddq testing of CMOS circuits
Author :
Lupon, Emili ; Gorriz, G. ; Martinez, Carlos ; Figueras, Jaume
Author_Institution :
Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
4/29/1993 12:00:00 AM
Abstract :
A compact built-in current sensor based on a slightly modified latch comparator is presented, which allows fast detection and memorising of excessively high quiescent current without the need for a voltage reference. Response time, virtual ground distortion and silicon overhead are analysed in order to evaluate the sensor performance.
Keywords :
CMOS integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; CMOS circuits; compact built-in current sensor; latch comparator; quiescent current detection; response time; silicon overhead; virtual ground distortion;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19930517
