Title :
Timing extraction at high bit densities
Author_Institution :
Mitre Corporation, Bedford, Mass.
fDate :
6/1/1966 12:00:00 AM
Keywords :
Circuits; Data mining; Delay effects; Delay lines; Frequency; Intersymbol interference; Sampling methods; Timing; Voltage; Voltage-controlled oscillators;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1966.264503
