• DocumentCode
    888572
  • Title

    A 1.2-V 37–38.5-GHz Eight-Phase Clock Generator in 0.13- μm CMOS Technology

  • Author

    Cho, Lan-Chou ; Lee, Chihun ; Liu, Shen-Iuan

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Inst. of Technol., Taipei
  • Volume
    42
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1261
  • Lastpage
    1270
  • Abstract
    A 37-38.5-GHz clock generator is presented in this paper. An eight-phase LC voltage-controlled oscillator (VCO) is presented to generate the multiphase outputs. The high-pass characteristic CL ladder topology sustains the high-frequency signals. The split-load divider is presented to extend the input frequency range. The proposed PD improves the static phase error and enhances the gain. To verify the function of each block and modify the operation frequency, two additional testing components-an eight-phase VCO and a split-load frequency divider-are fabricated using 0.13-mum CMOS technology. The measured quadrature-phase outputs of VCO and input sensitivity of the divider are presented. This clock generator has been fabricated with 0.13-mum CMOS technology. The measured rms clock jitter is 0.24 ps at 38 GHz while consuming 51.6 mW without buffers from a 1.2-V supply. The measured phase noise is -97.55 dBc/Hz at 1-MHz offset frequency
  • Keywords
    CMOS analogue integrated circuits; clocks; field effect MIMIC; frequency dividers; millimetre wave oscillators; signal generators; timing circuits; voltage-controlled oscillators; 0.13 micron; 1.2 V; 37 to 38.5 GHz; 51.6 mW; CL ladder topology; CMOS Technology; LC voltage-controlled oscillator; PLL; VCO; clock generator; high-pass characteristic; multiphase output; phase-locked loop; split-load frequency divider; CMOS technology; Clocks; Frequency conversion; Frequency measurement; Jitter; Noise measurement; Phase measurement; Testing; Topology; Voltage-controlled oscillators; Clock generator; phase-locked loop (PLL);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.897169
  • Filename
    4214959