DocumentCode :
888616
Title :
Dust test results on multicontact circuit board connectors
Author :
DeNure, Douglas G. ; Sproles, Edward S., Jr.
Author_Institution :
AT&T Bell Labs., Whippany, NJ, USA
Volume :
14
Issue :
4
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
802
Lastpage :
808
Abstract :
A study to determine if the normal force of a connector is a factor in maintaining a low contact resistance after an accumulation of dust in the pins and receptacles is discussed. A dust mixture of hygroscopic salts and natural mineral particles was used. The test connectors included the standard 2-mm connector with a nominal normal force of 0.55 N, a special 2-mm connector with an extra low normal force of 0.35 N, and another connector with a normal force of about 1.5 N. Resistance values, as compared with values measured before the dust exposure, increased by less than 4 mΩ for the contact pair showing the largest increase. The results indicate that the lower normal force in high-density connectors does not adversely affect the ability of the connector system to tolerate particulate contaminants
Keywords :
contact resistance; dust; electric connectors; printed circuit accessories; printed circuit testing; dust mixture; dust test; high-density connectors; hygroscopic salts; low contact resistance; multicontact circuit board connectors; natural mineral particles; normal force; particulate contaminants; Circuit testing; Connectors; Contact resistance; Electrical resistance measurement; Force measurement; Measurement standards; Minerals; Pins; Pollution measurement; Printed circuits;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.105137
Filename :
105137
Link To Document :
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