DocumentCode :
888724
Title :
Investigation into SiGe HBT class E/F PA efficiency at 2 GHz for VDD from 1 to 1.8 V
Author :
O´Sullivan, J.A. ; McCarthy, K.G. ; Murphy, A.C. ; Murphy, P.J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Ireland
Volume :
16
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
170
Lastpage :
172
Abstract :
This letter presents a 2-GHz SiGe heterojunction bipolar transistor fully integrated class E/F power amplifier (PA) design operating at low supply voltage. A maximum measured power added efficiency (PAE) of 39% is achieved for a supply voltage of 1.8V. At 1V, a maximum PAE of 36% is measured. The PA was fabricated using an advanced 0.18-μm BiCMOS process.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; UHF integrated circuits; UHF power amplifiers; bipolar integrated circuits; low-power electronics; 0.18 micron; 1 to 1.8 V; 2 GHz; BiCMOS process; SiGe; heterojunction bipolar transistors; integrated HBT class E-F power amplifier; BiCMOS integrated circuits; Germanium silicon alloys; Heterojunction bipolar transistors; Low voltage; Power amplifiers; Power measurement; Silicon germanium; Switches; Thermal conductivity; Transceivers; Class E/F; RFIC power amplifier (PA); heterojunction bipolar transistor (HBT);
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2006.872144
Filename :
1613885
Link To Document :
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