• DocumentCode
    888796
  • Title

    Comparison of SEU rate prediction techniques

  • Author

    Petersen, E.L. ; Adams, J.H., Jr.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    39
  • Issue
    6
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1836
  • Lastpage
    1839
  • Abstract
    A variety of methods are in use for predicting upset rates. The predictions of several of these methods are compared with flight data from the microelectronics package on the CRRES (Combined Release and Radiation Effects Satellite). The implications of current cosmic ray research relative to these results are discussed. The CRRES data appear to satisfy the mission goal of pointing to a good method of calculating upset rates in space. The data in their present form demonstrate the problems that exist when using a single threshold for all parts for upset rate predictions and point to the use of an integral approach using the rectangular parallelepiped geometry in a CREME-type code. The data also point toward the need for updated cosmic ray models for use with short missions
  • Keywords
    aerospace instrumentation; aerospace simulation; aerospace testing; integrated circuit testing; radiation effects; radiation hardening (electronics); semiconductor device testing; CREME-type code; CRRES; Combined Release and Radiation Effects Satellite; SEU rate prediction techniques; integral approach; microelectronics package; rectangular parallelepiped geometry; short missions; updated cosmic ray models; Astronomy; Extraterrestrial measurements; Laboratories; Microelectronics; Packaging; Predictive models; Radiation effects; Satellites; Shape; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.211374
  • Filename
    211374