Survivability of high-Tc microwave devices in space radiation environments

In order to investigate the suitability of high-T_c devices for satellite applications, a High Temperature Superconductivity Space Experiment (HTSSE I) is due for launch in 1993. The purpose of the present study is to examine the effect of nonionizing radiation on the performance of high-T_c devices intended for deployment on HTSSE I. A low-temperature radiation damage study of first-generation passive microwave devices fabricated from high-temperature cuprate superconductors has been performed in order to examine the effects of nonionizing radiation damage. Changes in performance due to radiation-induced shifts in the transition temperature and to film erosion are discussed. The results show that if these relatively simple passive devices are reasonably well shielded, they should survive in typical five-year space applications