DocumentCode

889024

Title

A pattern recognition experiment with near-optimum results

Author

Rosen, C. A. ; Hall, D. J.

Author_Institution

Applied Physics Lab., Stanford Research Inst., Menlo Park, Calif.

Issue

4

fYear

1966

Firstpage

666

Lastpage

667

Keywords

Automatic testing; Learning systems; Machine learning; Pattern recognition; Performance evaluation; Prototypes; Shape; System testing;

fLanguage

English

Journal_Title

Electronic Computers, IEEE Transactions on

Publisher

ieee

ISSN

0367-7508

Type

jour

DOI

10.1109/PGEC.1966.264394

Filename

4038845