Title :
A pattern recognition experiment with near-optimum results
Author :
Rosen, C. A. ; Hall, D. J.
Author_Institution :
Applied Physics Lab., Stanford Research Inst., Menlo Park, Calif.
Keywords :
Automatic testing; Learning systems; Machine learning; Pattern recognition; Performance evaluation; Prototypes; Shape; System testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1966.264394
