DocumentCode
889141
Title
Measuring the delay of sub-nanosecond circuits
Author
Farber, A.
Volume
55
Issue
4
fYear
1967
fDate
4/1/1967 12:00:00 AM
Firstpage
560
Lastpage
561
Abstract
Sources of error in present methods of measuring circuit delay are described, along with a new technique which is particularly well suited to sub-nanosecond measurements. This technique measures the insertion delay of the circuit in a transmission system, has a time resolution of less than 10 picoseconds, and is directly calibrated in terms of length and the speed of light.
Keywords
Autocorrelation; Circuit testing; Delay effects; Oscillators; Oscilloscopes; Packaging; Photography; Propagation delay; Pulse generation; Sampling methods;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.5585
Filename
1447515
Link To Document