DocumentCode :
889215
Title :
Modeling the time-dependent transient radiation response of semiconductor junctions
Author :
Wunsch, T.F. ; Axness, C.L.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
39
Issue :
6
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
2158
Lastpage :
2169
Abstract :
Analytical one-dimensional time-dependent photocurrent models are developed from new solutions to the ambipolar transport equation. The p-n junction model incorporates the effects of an electric field in the quasi-neutral region, finite diode length, and an arbitrary generation function g=f(x,t). It provides improved accuracy over the Wirth-Rogers and Enlow-Alexander models. An approximate photocurrent solution for p-n-n+, n-p-p+ , and p-i-n diode junctions is developed considering high-injection effects. Comparison with experimental data shows that a single set of physical parameters is adequate to characterize the model with respect to dose rate, pulse width, and geometry
Keywords :
electron beam effects; p-i-n diodes; p-n junctions; radiation effects; semiconductor device models; semiconductor diodes; transient response; ambipolar transport equation; analytical 1D time dependent photocurrent models; arbitrary generation function; electric field; electron beam irradiation; finite diode length; high-injection effects; n-p-p+ diode junctions; p-i-n diode junctions; p-n junction model; p-n-n+ diode junctions; quasi-neutral region; semiconductor junctions; time-dependent transient radiation response; Circuit analysis computing; Equations; Integrated circuit modeling; P-i-n diodes; P-n junctions; Photoconductivity; Semiconductor diodes; Semiconductor process modeling; Solid modeling; Space vector pulse width modulation;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.211417
Filename :
211417
Link To Document :
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