Title :
The Self-Diagnosability of a Computer
Author_Institution :
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, Calif.
Abstract :
Maximum capability for self-diagnosis with minimum additional hardware is the goal of every designer of a general purpose computer today. A yardstick with which the self-diagnosability of a system can be measured is proposed.
Keywords :
Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Hardware; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit testing; System testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1966.264570
