Title :
Proton-induced SEU, dose effects, and LEO performance predictions for R3000 microprocessors
Author :
Shaeffer, D.L. ; Kimbrough, J.R. ; Wilburn, J.W. ; Denton, S.M. ; Kaschmitter, J.L. ; Colella, N.J. ; Coakley, P.G. ; Casteneda, C.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
The authors present low-energy (⩽60-MeV) proton exposure test results for commercial unhardened versions of the MIPS Computer Systems R3000 and R3000A microprocessors from four different vendors, and they compare these results with previously obtained data at 256 MeV. Proton SEU (single event upset) cross sections and total dose hardness values are presented. Two of the processors functioned to about 1 Mrad. All processors, with one exception, remained functional above 40 krad. SEU cross sections were obtained with the use of specially designed software tests which were executed dynamically during radiation exposure of the chips. Radiation hardness and SEU are investigated for LEO (low earth orbit). Results indicate that commercial R3000 and R3000A microprocessors are suitable for multiyear operation at LEO altitudes in space
Keywords :
computer testing; dosimetry; microprocessor chips; proton effects; radiation hardening (electronics); 1×106 rad; 256 MeV; 40×103 rad; 60 MeV; R3000 microprocessors; R3000A microprocessors; cross sections; dose effects; low earth orbit; proton irradiation; radiation hardness; single event upset; total dose hardness; Computer aided instruction; Control systems; High performance computing; Low earth orbit satellites; Microprocessors; Military computing; Protons; Reduced instruction set computing; Software testing; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
