DocumentCode
889618
Title
A Large Area TDI Image Sensor for Low Light Level Imaging
Author
Farrier, Michael G. ; Dyck, Rudolph H.
Volume
15
Issue
4
fYear
1980
Firstpage
753
Lastpage
758
Abstract
A 1030 X 128 element time delay and integration (TDI) CCD image sensor has been developed for low-light-level (L/sup 3/) imaging applications. For L/sup 3/ imaging, output is derived from a high-gain low-noise floating-gate amplifier (FGA). For larger input signal levels, a second, resettable floating-gate amplifier (RFGA) with lower gain and wider dynamic range provides output in parallel to the FGA. The device features four-phase buried-channel construction and a polysilicon gate design tailored to produce optimum broad-band responsivity. Input signal levels of 500 electrons have been successfully imaged and amplifier noise levels of approximately 20 electrons have been observed.
Keywords
Charge-coupled device circuits; Image sensors; Cameras; Charge-coupled image sensors; Delay effects; Dynamic range; Electrons; High-resolution imaging; Image sensors; Lighting; Semiconductor device measurement; Sensor arrays;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1980.1051465
Filename
1051465
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