Title :
Measurement of the Permittivity of Insulating Films at Microwave Frequencies (Correspondence)
Author :
Sobol, H. ; Hughes, J.J.
Keywords :
Capacitance; Dielectric films; Dielectric measurements; Frequency measurement; Insulation; Microwave frequencies; Microwave measurements; Permittivity measurement; Resonant frequency; Substrates;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1967.1126476
