• DocumentCode
    889894
  • Title

    Correlations of dynamic mechanical measurements to the stress formation by molding compounds

  • Author

    Quella, Ferdinand ; Bogner, Manfred ; Holzapfel, Winfried ; Schwarz, Raimund

  • Author_Institution
    Siemens AG, Munchen, Germany
  • Volume
    14
  • Issue
    4
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    879
  • Lastpage
    885
  • Abstract
    Semiempirical estimation of stress by the integrated value of the products from shear modulus and the coefficients of thermal expansion are not suitable to differentiate between commercially used low-stress molding compounds. A modified evaluation procedure is presented. Prior to multiplying the curves of shear modulus and thermal expansion, one must shift to the same glass transition temperature (Tg ) because of all of the values are frequency dependent. The conclusion is that the Tg of improved compounds should be situated outside of all the occurring temperatures at given frequencies. Another influence on stress that must be considered is the adhesion strength between the molding compound and substrate (silicon, leadframe, etc.). The authors applied nondestructive testing methods for composites to the combination of the silicon and the compound. The data obtained by dynamic mechanical experiments are contradictory to published data. Post-cure increases the adhesion of standard compounds to the substrate, whereas adhesion of siloxane-modified low-stress compounds is weakened
  • Keywords
    VLSI; encapsulation; failure analysis; packaging; adhesion strength; coefficients of thermal expansion; dynamic mechanical measurements; estimation of stress; evaluation procedure; glass transition temperature; low-stress molding compounds; nondestructive testing methods; shear modulus; siloxane-modified low-stress compounds; stress formation by molding compounds; Adhesives; Frequency dependence; Glass; Mechanical variables measurement; Nondestructive testing; Silicon; Stress measurement; Temperature dependence; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.105149
  • Filename
    105149