Title :
Built-in self-diagnosis for repairable embedded RAMs
Author :
Treuer, Robert ; Agarwal, Vinod K.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
6/1/1993 12:00:00 AM
Abstract :
A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.<>
Keywords :
SRAM chips; built-in self test; integrated circuit testing; reduced instruction set computing; BISD; ROM; SRAMs; built-in self-diagnosis; design costs; diagnosis algorithms; external repair; hardware design; reduced-instruction-set processor; repairable embedded RAMs; static RAMs; stor capa 64 Kbit; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Fault detection; Fuses; Pins; Read-write memory;
Journal_Title :
Design & Test of Computers, IEEE
