Title :
Improving the convergence of vector fitting for equivalent circuit extraction from noisy frequency responses
Author :
Grivet-Talocia, Stefano ; Bandinu, Michelangelo
Author_Institution :
Dept. of Electron., Politecnico di Torino
Abstract :
The vector fitting (VF) algorithm has become a common tool in electromagnetic compatibility and signal integrity studies. This algorithm allows the derivation of a rational approximation to the transfer matrix of a given linear structure starting from measured or simulated frequency responses. This paper addresses the convergence properties of a VF when the frequency samples are affected by noise. We show that small amounts of noise can seriously impair or destroy convergence. This is due to the presence of spurious poles that appear during the iterations. To overcome this problem we suggest a simple modification of the basic VF algorithm, based on the identification and removal of the spurious poles. Also, an incremental pole addition and relocation process is proposed in order to provide automatic order estimation even in the presence of significant noise. We denote the resulting algorithm as vector fitting with adding and skimming (VF-AS). A thorough validation of the VF-AS algorithm is presented using a Monte Carlo analysis on synthetic noisy frequency responses. The results show excellent convergence and significant improvements with respect to the basic VF iteration scheme. Finally, we apply the new VF-AS algorithm to measured scattering responses of interconnect structures and networks typical of high-speed digital systems
Keywords :
equivalent circuits; frequency response; iterative methods; Monte Carlo analysis; electromagnetic compatibility; equivalent circuit extraction; iteration scheme; signal integrity; spurious poles removal; synthetic noisy frequency responses; transfer matrix; vector fitting with adding and skimming; Approximation algorithms; Circuit noise; Circuit simulation; Convergence; Electromagnetic compatibility; Electromagnetic measurements; Equivalent circuits; Frequency measurement; Monte Carlo methods; Vectors; Circuit extraction; linear macromodeling; noise; rational approximation; vector fitting;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2006.870814