• DocumentCode
    890026
  • Title

    Improving the convergence of vector fitting for equivalent circuit extraction from noisy frequency responses

  • Author

    Grivet-Talocia, Stefano ; Bandinu, Michelangelo

  • Author_Institution
    Dept. of Electron., Politecnico di Torino
  • Volume
    48
  • Issue
    1
  • fYear
    2006
  • Firstpage
    104
  • Lastpage
    120
  • Abstract
    The vector fitting (VF) algorithm has become a common tool in electromagnetic compatibility and signal integrity studies. This algorithm allows the derivation of a rational approximation to the transfer matrix of a given linear structure starting from measured or simulated frequency responses. This paper addresses the convergence properties of a VF when the frequency samples are affected by noise. We show that small amounts of noise can seriously impair or destroy convergence. This is due to the presence of spurious poles that appear during the iterations. To overcome this problem we suggest a simple modification of the basic VF algorithm, based on the identification and removal of the spurious poles. Also, an incremental pole addition and relocation process is proposed in order to provide automatic order estimation even in the presence of significant noise. We denote the resulting algorithm as vector fitting with adding and skimming (VF-AS). A thorough validation of the VF-AS algorithm is presented using a Monte Carlo analysis on synthetic noisy frequency responses. The results show excellent convergence and significant improvements with respect to the basic VF iteration scheme. Finally, we apply the new VF-AS algorithm to measured scattering responses of interconnect structures and networks typical of high-speed digital systems
  • Keywords
    equivalent circuits; frequency response; iterative methods; Monte Carlo analysis; electromagnetic compatibility; equivalent circuit extraction; iteration scheme; signal integrity; spurious poles removal; synthetic noisy frequency responses; transfer matrix; vector fitting with adding and skimming; Approximation algorithms; Circuit noise; Circuit simulation; Convergence; Electromagnetic compatibility; Electromagnetic measurements; Equivalent circuits; Frequency measurement; Monte Carlo methods; Vectors; Circuit extraction; linear macromodeling; noise; rational approximation; vector fitting;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2006.870814
  • Filename
    1614044