DocumentCode
890308
Title
A Modification of Lee´s Path Connection Algorithm
Author
Akers, Sheldon B., Jr.
Author_Institution
Electronics Laboratory, General Electric Company, Syracuse, N. Y.
Issue
1
fYear
1967
Firstpage
97
Lastpage
98
Abstract
It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying to eliminate certain kinds of redundancy from the circuit. However, single-fault analysis may remain valid for some types of redundancy which serve a useful purpose, such as the elimination of logic hazards in two-level circuits.
Keywords
Joining processes; Printed circuits;
fLanguage
English
Journal_Title
Electronic Computers, IEEE Transactions on
Publisher
ieee
ISSN
0367-7508
Type
jour
DOI
10.1109/PGEC.1967.264620
Filename
4038994
Link To Document