• DocumentCode
    890308
  • Title

    A Modification of Lee´s Path Connection Algorithm

  • Author

    Akers, Sheldon B., Jr.

  • Author_Institution
    Electronics Laboratory, General Electric Company, Syracuse, N. Y.
  • Issue
    1
  • fYear
    1967
  • Firstpage
    97
  • Lastpage
    98
  • Abstract
    It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying to eliminate certain kinds of redundancy from the circuit. However, single-fault analysis may remain valid for some types of redundancy which serve a useful purpose, such as the elimination of logic hazards in two-level circuits.
  • Keywords
    Joining processes; Printed circuits;
  • fLanguage
    English
  • Journal_Title
    Electronic Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0367-7508
  • Type

    jour

  • DOI
    10.1109/PGEC.1967.264620
  • Filename
    4038994