DocumentCode :
890510
Title :
Analytic Carrier-Based Charge and Capacitance Model for Long-Channel Undoped Surrounding-Gate MOSFETs
Author :
He, Jin ; Bian, Wei ; Tao, Yadong ; Yang, Shengqi ; Tang, Xu
Author_Institution :
Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing
Volume :
54
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
1478
Lastpage :
1485
Abstract :
Three terminal charges and nine intrinsic capacitances associated to the gate, source, and drain terminals of long-channel undoped surrounding-gate (SRG) MOSFETs are derived physically from an exact analytical solution of the channel current-continuity principle and channel charge-partition scheme in this paper. Although requiring lengthy and complex mathematical expressions, all explicit solutions for the capacitances can be obtained analytically. The validity of the analytical solutions is confirmed by comparing model predictions with simulation data obtained using the 3-D numerical solvers. The explicit expressions to the terminal charges and transcapacitance not only lead to a clearer understanding of SRG MOSFET device physics but also provide a better infrastructure to develop a complete carrier-based model for the SRG-MOSFET-based circuit simulation
Keywords :
MOSFET; numerical analysis; semiconductor device models; 3D numerical solvers; MOSFET device physics; capacitance model; carrier-based charge model; channel charge-partition scheme; channel current-continuity principle; circuit simulation; compact model; exact analytical solution; explicit expressions; intrinsic capacitances; long-channel undoped surrounding-gate MOSFET; terminal charges; CMOS technology; Capacitance; Circuit simulation; Computer science; Helium; MOSFETs; Microelectronics; Physics; Predictive models; Semiconductor device modeling; Carrier-based approach; compact model; device physics; nonclassical CMOS; surrounding-gate (SRG) MOSFET;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.896595
Filename :
4215177
Link To Document :
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