DocumentCode :
890684
Title :
Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel
Author :
Park, Choon-Sang ; Tae, Heung-Sik ; Kwon, Young-Kuk ; Heo, Eun Gi
Author_Institution :
Kyungpook Nat. Univ., Daegu
Volume :
54
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
1315
Lastpage :
1320
Abstract :
Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in both the image sticking and boundary image sticking cells. Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by Vt close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses.
Keywords :
magnesium compounds; phosphors; plasma displays; scanning electron microscopy; secondary ion mass spectroscopy; sputter deposition; surface discharges; time of flight mass spectroscopy; AC plasma display panel; MgO; boundary image sticking cells; discharge characteristics; discharge region; halo-type boundary image sticking; infrared-emission observations; luminance observations; nondischarge region; phosphor layer; scanning electron microscope analysis; sputter deposition; time-of-flight secondary ion mass spectrometry; visible-conversion characteristics; Business; Helium; Image analysis; Mass spectroscopy; Phosphors; Plasma displays; Scanning electron microscopy; Surface discharges; Surface morphology; Technological innovation; 42-in ac plasma display panel (PDP) module; $V_{t}$ close curve; Halo-type boundary image sticking; redeposition of Mg species; scanning electron microscope (SEM) analyses; time-of-flight secondary ion mass spectrometry (TOF-SIMS);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.896578
Filename :
4215194
Link To Document :
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