• DocumentCode
    891080
  • Title

    Anomalies in transistor low-frequency noise

  • Author

    Verster, T.C.

  • Volume
    55
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    1204
  • Lastpage
    1205
  • Abstract
    Accurate low-frequency noise measurements over the range of 1 Hz to 10 kHz on a number of different transistor types showed that the majority obey the f-law, the factor α being between 0.96 and 1.23. Certain samples, however, exhibited an additional noise component with a frequency dependence of the form [1 + (f/f0)2]-1.
  • Keywords
    Detectors; Extrapolation; Low-frequency noise; Low-noise amplifiers; Manufacturing; Noise level; Noise measurement; Radio frequency; Stability; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5785
  • Filename
    1447715