DocumentCode :
891080
Title :
Anomalies in transistor low-frequency noise
Author :
Verster, T.C.
Volume :
55
Issue :
7
fYear :
1967
fDate :
7/1/1967 12:00:00 AM
Firstpage :
1204
Lastpage :
1205
Abstract :
Accurate low-frequency noise measurements over the range of 1 Hz to 10 kHz on a number of different transistor types showed that the majority obey the f-α-law, the factor α being between 0.96 and 1.23. Certain samples, however, exhibited an additional noise component with a frequency dependence of the form [1 + (f/f0)2]-1.
Keywords :
Detectors; Extrapolation; Low-frequency noise; Low-noise amplifiers; Manufacturing; Noise level; Noise measurement; Radio frequency; Stability; Voltmeters;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.5785
Filename :
1447715
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=891080
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