DocumentCode :
891147
Title :
Pitfalls in the evaluation of cathode properties from I V characteristics
Author :
Hasker, Jan ; Van Dorst, Peter A M
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Volume :
36
Issue :
1
fYear :
1989
fDate :
1/1/1989 12:00:00 AM
Firstpage :
201
Lastpage :
208
Abstract :
It is shown that three-halves power dependence between current and applied voltage does not guarantee sufficient electron emission all over the entire cathode area, but deviations from this dependence do not necessarily imply poor emission. The derivation of the work function from a measured I-V characteristic is obscured not only by space-charge and patch size distribution, but also by the beamlet effect. However, this effect is used to determine the barium diffusion length over a surface from a measurement of electrical current. It is also found that to obtain planar diode conditions, the distance between cathode and anode has to be smaller than about one tenth of the cathode diameter. A method that can be used to demonstrate changes in cathode series resistance curing cathode life is considered. For patchy cathodes the zero field current density is not equal to the current density obtained from Schottky extrapolation. To determine the latter properly from feasible experiments, the space charge in the saturation region has to be taken into account, i.e. space-charge correction is essential to the determination of Richardson constant and work function from a Richardson plot
Keywords :
electron tube testing; thermionic cathodes; thermionic electron emission; I-V characteristics; Richardson constant; Richardson plot; Schottky extrapolation; beamlet effect; cathode series resistance; current density; electron emission; entire cathode area; evaluation of cathode properties; measurement of electrical current; patch size distribution; patchy cathodes; pitfalls; planar diode conditions; saturation region; space-charge correction; thermionic cathodes evaluation; three-halves power dependence; work function; zero field current density; Barium; Cathodes; Current density; Current measurement; Electrical resistance measurement; Electron emission; Length measurement; Size measurement; Surface resistance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.21206
Filename :
21206
Link To Document :
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