DocumentCode
891341
Title
Interconnection delays in MOSFET VLSI
Author
Elmasry, Mohamed I.
Volume
16
Issue
5
fYear
1981
fDate
10/1/1981 12:00:00 AM
Firstpage
585
Lastpage
591
Abstract
Although VLSI MOSFET devices have small inherent delays, the RC time constant of the interconnections limits the circuit maximum frequency of operation. A circuit-based solution to this problem, rather than a technology-based solution, is to use circuit configurations that maximize the charging/discharging currents delivered to the interconnections. This paper examines the different MOSFET circuit configurations based on the ability to charge/discharge the RCs of the interconnections and concludes that two circuit configurations are most suitable for VLSI: CMOS and a proposed current steering NMOS. In the latter configuration, the distributed RC network of the interconnection is included in a charging/discharging circuit path which is part of a difference stage. A multisource MOSFET structure is used in the design of the difference stage, in a common-drain/common-gate configuration to maximize the charging/discharging currents. Computer simulation using SPICE 2 and experimental measurements are used to confirm the predicted performance.
Keywords
Field effect integrated circuits; Integrated logic circuits; Large scale integration; field effect integrated circuits; integrated logic circuits; large scale integration; CMOS technology; Computer simulation; Delay effects; Frequency; Integrated circuit interconnections; MOS devices; MOSFET circuits; Parasitic capacitance; SPICE; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1981.1051641
Filename
1051641
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