• DocumentCode
    891341
  • Title

    Interconnection delays in MOSFET VLSI

  • Author

    Elmasry, Mohamed I.

  • Volume
    16
  • Issue
    5
  • fYear
    1981
  • fDate
    10/1/1981 12:00:00 AM
  • Firstpage
    585
  • Lastpage
    591
  • Abstract
    Although VLSI MOSFET devices have small inherent delays, the RC time constant of the interconnections limits the circuit maximum frequency of operation. A circuit-based solution to this problem, rather than a technology-based solution, is to use circuit configurations that maximize the charging/discharging currents delivered to the interconnections. This paper examines the different MOSFET circuit configurations based on the ability to charge/discharge the RCs of the interconnections and concludes that two circuit configurations are most suitable for VLSI: CMOS and a proposed current steering NMOS. In the latter configuration, the distributed RC network of the interconnection is included in a charging/discharging circuit path which is part of a difference stage. A multisource MOSFET structure is used in the design of the difference stage, in a common-drain/common-gate configuration to maximize the charging/discharging currents. Computer simulation using SPICE 2 and experimental measurements are used to confirm the predicted performance.
  • Keywords
    Field effect integrated circuits; Integrated logic circuits; Large scale integration; field effect integrated circuits; integrated logic circuits; large scale integration; CMOS technology; Computer simulation; Delay effects; Frequency; Integrated circuit interconnections; MOS devices; MOSFET circuits; Parasitic capacitance; SPICE; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1981.1051641
  • Filename
    1051641