Title :
A 20 ns, low power, NMOS 1Kx4 static RAM
Author :
Rhodes, Clifford ; Pinkham, Ray ; Valente, Fred ; Ramsey, Richard
Abstract :
Using scaled NMOS processing and novel circuit design techniques to enhance the speed-power product, a high-speed, low power, fully static 1024-word/spl times/4-bit random access memory has been developed. Applications related requirements such as fast chip select access time and /spl times/4 organization for cache and microcode store memories are central to the device definition. Highly producible 4.5 /spl mu/m design rules with 2.5 /spl mu/m polysilicon gate lengths are incorporated in addition to depletion load transistors in the memory array. The resulting TTL-compatible, 5 V only 1K/spl times/4 static RAM achieves a typical address access time of 20 ns and a chip select access time of 5 ns with power dissipation under 350 mW.
Keywords :
Field effect integrated circuits; Integrated memory circuits; Large scale integration; Random-access storage; field effect integrated circuits; integrated memory circuits; large scale integration; random-access storage; Circuit simulation; Circuit testing; Decoding; Differential amplifiers; Electronic equipment testing; MOS devices; PROM; Propagation delay; Random access memory; Read-write memory;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1981.1051643