DocumentCode
891406
Title
Increased resistance of crystal units at oscillator noise levels
Author
Bernstein, Michael
Volume
55
Issue
7
fYear
1967
fDate
7/1/1967 12:00:00 AM
Firstpage
1239
Lastpage
1241
Abstract
Problems have been experienced with inoperative military equipment which have been traced to a defect in some quartz crystal units. This defect has been determined to be an increase in resistance (loss of Q) of crystal resonators when excited at very low power levels. The typical crystal oscillator, when first turned on, excites the resonator with thermal noise and consequently the power dissipated is very small. Simple instrumentation has been assembled to show clearly the low power increased crystal resistance effect. Tests have shown that surface defects, due to the final lapping process, contribute to the problem. The necessity of surface etch to remove the damaged surface layer is shown to be required to avoid defective crystal units.
Keywords
Assembly; Capacitors; Electrical resistance measurement; Etching; Military equipment; Noise level; Shape; Testing; Voltage; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.5819
Filename
1447749
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