• DocumentCode
    891406
  • Title

    Increased resistance of crystal units at oscillator noise levels

  • Author

    Bernstein, Michael

  • Volume
    55
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    1239
  • Lastpage
    1241
  • Abstract
    Problems have been experienced with inoperative military equipment which have been traced to a defect in some quartz crystal units. This defect has been determined to be an increase in resistance (loss of Q) of crystal resonators when excited at very low power levels. The typical crystal oscillator, when first turned on, excites the resonator with thermal noise and consequently the power dissipated is very small. Simple instrumentation has been assembled to show clearly the low power increased crystal resistance effect. Tests have shown that surface defects, due to the final lapping process, contribute to the problem. The necessity of surface etch to remove the damaged surface layer is shown to be required to avoid defective crystal units.
  • Keywords
    Assembly; Capacitors; Electrical resistance measurement; Etching; Military equipment; Noise level; Shape; Testing; Voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5819
  • Filename
    1447749