• DocumentCode
    891551
  • Title

    Impact of Large Scale Integration on Aerospace Computers

  • Author

    Joseph, Earl C

  • Author_Institution
    UNIVAC, Federal Systems Division of the Sperry Rand Corporation, St. Paul, Minn.
  • Issue
    5
  • fYear
    1967
  • Firstpage
    558
  • Lastpage
    561
  • Abstract
    The continued development of Large Scale Integration (LSI) presages the advent of a fourth generation of computers, and is causing an upheaval at all levels of computer technology¿both technical and managerial. Today´s computers use integrated circuit components containing at most ten gates per component; however, LSI is introducing hundreds of gates per component and will eventually evolve into thousands of gates per component. To the aerospace planner, this technological breakthrough of LSI means tremendous reductions in cost, size, weight, and power consumption of logic components, together with increased speed and reliability. However, for the aerospace planner to successfully implement aerospace computers with LSI, the computer designers and managers must reorient their methodology and goals. A multitude of new design and cost considerations must be carefully scrutinized, and out of this must come the new techniques that will permit effective incorporation of LSI in aerospace computers. Higher speed, a smaller system, greater reliability, and lower cost stem from the physical structure (more gates per component with no increase in component size) of the LSI component. These inherent features of LSI, together with multiprocessor system organization, point to future aerospace computers with capabilities equal to today´s best ground base systems.
  • Keywords
    Application software; Computational modeling; Computer aided manufacturing; Computer simulation; Costs; Energy consumption; Large scale integration; Logic design; Space technology; Technology management; Aerospace computers (digital); Large Scale Integration (LSI); design simulation; functional system organization; parity checking; pin minimization; self-repair; standardization;
  • fLanguage
    English
  • Journal_Title
    Electronic Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0367-7508
  • Type

    jour

  • DOI
    10.1109/PGEC.1967.264741
  • Filename
    4039144