Title :
Protection of semiconductor devices, circuits, and equipment from voltage transients
Author_Institution :
U.S. Army Electronics Command, Fort Monmouth, N.J.
Abstract :
In this paper a survey is presented of the means that can be applied to the suppression of voltage transients that can affect the reliability of equipment and systems employing semiconductor devices. Consideration is given to some of the ways transients are generated, their duration and magnitudes, and the approach taken in the military standard MIL-STD-704 in confining the power supply characteristics within definite limits which must be tolerated by the utilization equipment. Emphasis is placed on the various techniques--their advantages and limitations--that can be applied in suppressing transients generated from 28-volt dc power supplies. In addition, various device approaches used to limit voltage transients to rectifier diodes are also presented.
Keywords :
Character generation; Circuits; Military standards; Power generation; Power supplies; Power system reliability; Protection; Semiconductor device reliability; Semiconductor devices; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.5835