DocumentCode :
891571
Title :
A destructive instability in selective high-power amplifiers with bipolar transistors
Author :
Ortler, Georg ; Flachenecker, Gunter
Volume :
16
Issue :
6
fYear :
1981
Firstpage :
703
Lastpage :
707
Abstract :
An oscillation mode is described which, under certain circumstances, can be excited in selective high-power amplifiers with bipolar transistors. This instability can arise after a single saturation of the transistor and does not depend on feedback or parasitic elements. It is caused by the storage time of the transistor after a saturation. Out of the oscillation mechanism it is shown that transistor voltages and currents during this oscillation mode can be manifold the values of the normal operation. On this account, usually one or a few oscillations of this mode destroy the output transistor, either by voltage of current overload. A computation method is shown with stability charts which describe stability conditions of a given amplifier, depending on the values of the elements of the peripheral circuitry.
Keywords :
Bipolar transistor circuits; Power amplifiers; bipolar transistor circuits; power amplifiers; Bipolar transistors; Breakdown voltage; Circuit stability; Feedback; High power amplifiers; Impedance; Operational amplifiers; Power generation; RLC circuits; Resonance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1981.1051665
Filename :
1051665
Link To Document :
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