Title :
The saturation characteristics of high-voltage transisitors
Author_Institution :
Texas Instruments Incorporated, Dallas, Tex.
Abstract :
It is shown that the saturation characteristic of high-voltage NPvN transistors can only be explained by a lowering of the v-layer resistance due to conductivity modulation. A semi-quantitative model is developed which explains this modified saturation region. An experimental method of isolating the resistive portion of the external collector-base (CB) voltage is presented. The results verify that the CB junction may be forward-biased even when the characteristic seemingly indicates that the transistor is unsaturated. Data is also presented showing how variations in collector resistivity and thickness alter the saturation region.
Keywords :
Breakdown voltage; Conductivity; Current density; Instruments; Low voltage; Power transistors; Proximity effect; Semiconductor diodes; Switches;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.5839