Title :
On Finding a Minimal Set of Diagnostic Tests
Author_Institution :
General Electric Co., Syracuse, N. Y.
Abstract :
A method is described for constructing a set of input patterns able to detect every given failure of a combinational network. The result may not be a minimal set of tests, but it is surely a complete test.
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Decoding; Laboratories; Switching circuits; Terminology; Weight control;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1967.264778
