Title :
A Cellular Threshold Array
Author :
Kautz, William H.
Author_Institution :
Stanford Research Institute, Menlo Park, Calif.
Abstract :
The purpose of this paper is to describe the design of an all-digital cellular threshold array that is well adapted to realization by large-scale integrated semiconductor technology. A set of these arrays may be interconnected to realize arbitrary combinational or sequential logic, or may be stacked to form a multilevel adaptive pattern classification machine.
Keywords :
Adaptive arrays; Automata; Circuit testing; Electrical fault detection; Electronic equipment testing; Integrated circuit technology; Large scale integration; Logic arrays; Logic testing; Pattern classification; Cellular logic; large-scale integration; logic arrays; pattern classification machines; switching functions; threshold logic;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1967.264780
