DocumentCode :
891952
Title :
Fabrication of Si MOSFET´s Using Neutron-Irradiated Silicon as Semi-Insulating Substrate
Author :
Ho, Vu Quoc ; Sugano, Takuo
Volume :
17
Issue :
2
fYear :
1982
fDate :
4/1/1982 12:00:00 AM
Firstpage :
117
Lastpage :
121
Abstract :
The feasibility of a novel silicon-on-semi-insulating substrate structure has been demonstrated. MOS field-effect transistors (MOSFET´s) are fabricated on neutron-irradiated silicon wafers which are used as semi-insulating substrates. In order to keep the substrate semi-insulating, laser annealing is used to make the semiconducting layer, and to activate the impurities implanted in the semiconducting layer, and plasma anodization is employed to grow the gate oxide. The, mobility of carrier in the channel is about 100 cm2/V ˙s for p-channel MOSFET´s and 300 cm2/V ˙s for n-channel devices. This structure has inherent advantages such as crystallographicafly single crystalline.
Keywords :
Anodisation; Carrier mobility; Field effect integrated circuits; Insulated gate field effect transistors; Integrated circuit technology; Large scale integration; Laser beam annealing; Neutron effects; Annealing; Crystallography; FETs; Optical device fabrication; Plasma devices; Semiconductivity; Semiconductor impurities; Semiconductor lasers; Silicon; Substrates;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1982.1051702
Filename :
1051702
Link To Document :
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