• DocumentCode
    8922
  • Title

    Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection

  • Author

    Hsuan-Ming Huang ; Wen, C.H.-P.

  • Author_Institution
    Dept. of the Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    30
  • Issue
    2
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    77
  • Lastpage
    86
  • Abstract
    Soft errors are a growing concern in highly scaled CMOS technologies; estimating error rates for a given design remains very challenging. This article presents a fast statistical soft-error-rate analysis approach that is nearly as accurate as computationally complex Monte Carlo SPICE simulation.
  • Keywords
    CMOS integrated circuits; Monte Carlo methods; SPICE; integrated circuit design; radiation hardening (electronics); statistical analysis; CMOS technology; Monte Carlo SPICE simulation; full-spectrum charge collection; statistical soft-error-rate analysis; Circuit faults; Computational modeling; Error analylsis; Integrated circuit modeling; Logic gates; Monte Carlo methods; Support vector machines; Transient analysis; Monte Carlo; SVM; process variation; soft error;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2194471
  • Filename
    6182680
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=8922