• DocumentCode
    892211
  • Title

    Effect of Scaling of Interconnections on the Time Delay of VLSI Circuits

  • Author

    Saraswat, Krishna C. ; Mohammadi, Farrokh

  • Volume
    17
  • Issue
    2
  • fYear
    1982
  • fDate
    4/1/1982 12:00:00 AM
  • Firstpage
    275
  • Lastpage
    280
  • Abstract
    Effect of scaling of dimensions, i.e., increase in chip size and decrease in minimum feature size, on the RC time delay associated with interconnections in VLSIC´s has been investigated. Analytical expressions have been developed to relate this time delay to various elements of technology, i.e., interconnection material, minimum feature size, chip area, length of the interconnect, etc. Empirical expressions to predict the trends of the technological elements as a function of chronological time have been developed. Calculations of time delay for interconnections made of poly-Si, WSi2, W, and Al have been done and they indicate that as the chip area is increased and other device-related dimensions are decreased the interconnection time delay becomes significant compared to the device time delay and in extreme cases dominates the chip performance.
  • Keywords
    Integrated circuit technology; Large scale integration; Metallisation; Monolithic integrated circuits; Conductivity; Delay effects; Dielectric materials; Etching; Inorganic materials; Integrated circuit interconnections; Materials science and technology; Silicides; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1982.1051729
  • Filename
    1051729