DocumentCode :
892323
Title :
Measured Noise Temperature Versus Theoretical Electron Temperature for Gas Discharge Noise Sources
Author :
Olson, Keith W.
Volume :
16
Issue :
9
fYear :
1968
fDate :
9/1/1968 12:00:00 AM
Firstpage :
640
Lastpage :
645
Abstract :
In the past, measured noise temperatures Tn of a few commercially available gas discharge noise sources were indicated as agreeing with the predicted electron temperature Te of the positive column based on the von Engel and Steenbeck relationship. Data were taken over the past 2 years on argon tubes over a pressure range of 5 to 40 mm and on neon tubes at 20 mm, with current variations from 100 to 300 mAdc. These data were compared against predicted electron temperatures. For the argon tubes at pressure-radius products greater than 20 mm˙cm there appeared to be reasonable correlation between the measured noise temperature and the predicted electron temperature although it is suggested that this correlation was fortuitous. For argon pressure-radius products less than 20 mm˙cm the measured noise temperature was as much as 15 percent lower than the predicted electron temperature. For neon tubes at 20-mm pressure, with the same variation in tube radius, and for pressure-radius products less than 24.0 mm˙cm, the measured noise temperature differed even more than for argon from the predicted electron temperature. A difference of as much as 30 percent at a pressure-radius product of 3.0 mm˙cm was observed. A qualitative explanation for argon is presented based mainly on the fact that these discharges do not have a Maxwellian distribution of electron velocities nor a velocity independent electron collision frequency. For neon the wide variation was not understood.
Keywords :
Argon; Current measurement; Discharges; Electron tubes; Insertion loss; Microwave measurements; NIST; Noise measurement; Signal to noise ratio; Temperature measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1968.1126766
Filename :
1126766
Link To Document :
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