Title :
Programming Mechanism of Polysilicon Resistor Fuses
fDate :
4/1/1982 12:00:00 AM
Abstract :
The programming characteristics of polysilicon resistor fuses were investigated. It was found that an open circuit occurs only after the fuse makes a transition to a second-breakdown state in which the current flow is mainly through a molten filament. Filamentary current flow is stable since the resistivity of silicon decreases abruptly upon melting. A simple model was developed which explains the observed I-V characteristics. Fuse opening occurs when the current in second breakdown exceeds a critical current lmin which depends strongly on the fuse thickness and the presence or absence of a passivation layer over the fuse. The gap forms at the positive end, suggesting that the silicon ions move by drift in the applied electric field.
Keywords :
Electric fuses; Integrated circuit technology; Large scale integration; Resistors; Silicon; Circuits; Contact resistance; Electric breakdown; Fuses; Power dissipation; Resistors; Silicon; Temperature; Thermal conductivity; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1982.1051740