CRRES Microelectronics Test Package (MEP)

Author

Mullen, E.G. ; Ray, K.P.

Volume

Issue

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

228

Lastpage

232

Abstract

The Microelectronics Test Package (MEP) flown onboard the Combined Release and Radiation Effects Satellite (CRRES) contained over 60 device types and approximately 400 total devices, which were tested for both single event upset (SEU) and total dose (parametric degradation and annealing). A description of the experiment, the method of testing the devices, and the structure of the data acquisition system are presented. Sample flight data are shown. These included SEUs from a GaAs 1K RAM during the March 1991 solar flare, and a comparison between passive shielding and a specially designed spot shielding package

Keywords

artificial satellites; automatic test equipment; automatic testing; computer testing; integrated circuit testing; radiation effects; 10³ Bytes; CRRES; Combined Release and Radiation Effects Satellite; GaAs; GaAs RAM; Microelectronics Test Package; data acquisition system; device testing; shielding; single event upsets; solar flare; total dose; Annealing; Data acquisition; Degradation; Gallium arsenide; Microelectronics; Packaging; Radiation effects; Satellites; Single event upset; System testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.212346

Filename

212346

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=892349