Title :
CRRES Microelectronics Test Package (MEP)
Author :
Mullen, E.G. ; Ray, K.P.
fDate :
4/1/1993 12:00:00 AM
Abstract :
The Microelectronics Test Package (MEP) flown onboard the Combined Release and Radiation Effects Satellite (CRRES) contained over 60 device types and approximately 400 total devices, which were tested for both single event upset (SEU) and total dose (parametric degradation and annealing). A description of the experiment, the method of testing the devices, and the structure of the data acquisition system are presented. Sample flight data are shown. These included SEUs from a GaAs 1K RAM during the March 1991 solar flare, and a comparison between passive shielding and a specially designed spot shielding package
Keywords :
artificial satellites; automatic test equipment; automatic testing; computer testing; integrated circuit testing; radiation effects; 103 Bytes; CRRES; Combined Release and Radiation Effects Satellite; GaAs; GaAs RAM; Microelectronics Test Package; data acquisition system; device testing; shielding; single event upsets; solar flare; total dose; Annealing; Data acquisition; Degradation; Gallium arsenide; Microelectronics; Packaging; Radiation effects; Satellites; Single event upset; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
