Title :
On the Utility and Measurement of Voltage Probability Density of Wide-Band Microwave Noise (Correspondence)
Author :
Gottfried, A.H. ; Tancredi, J.J.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Density measurement; Frequency measurement; Microwave devices; Microwave measurements; Microwave theory and techniques; Noise generators; Noise measurement; Sampling methods; Voltage measurement; Wideband;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1968.1126789
