Title : 
A Recursive Algorithm for Computing Exact Reliability Measures
         
        
            Author : 
Bailey, Michael Page ; Kulkarni, Vidyadhar G.
         
        
            Author_Institution : 
University of North Carolina, Chapel Hill
         
        
        
        
        
            fDate : 
4/1/1986 12:00:00 AM
         
        
        
        
            Abstract : 
An algorithm is presented to find source-to-K-terminal reliability in a directed graph with independent arc failures. The algorithm is based on a discrete-time Markov chain with two absorbing states. The Markov chain has an upper triangular transition probability matrix, thus the probability of absorption in a state can be found by back-substitution. We show: 1) The source-to-K-terminal reliability is the probability of absorption in a particular absorbing state; 2) The time until absorption can be used as an alternative reliability measure; and 3) The algorithm can be used to find a third reliability measure called the degree of connectedness.
         
        
            Keywords : 
Absorption; Algorithm design and analysis; Current measurement; Failure analysis; Length measurement; Linear systems; Particle measurements; Probability; Reliability theory; Time measurement;
         
        
        
            Journal_Title : 
Reliability, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TR.1986.4335338